RACK CARDS

The AFM topographs suggest that fabrication of even shorter channels may be possible. The process is robust with respect to variations of the droplet volume or the distance d, which are caused by external perturbations of the droplet flight direction or changing ejection conditions at the nozzle. Device yields in our experiments, which were performed in a normal laboratory atmosphere, appear to be limited only by dust contamination. No evidence for accidental shorts between source and drain electrodes was found.